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2000. Vol. 6. Suppl. 2, Proceedings : Microscopy and Microanalysis 2000 : Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada 27th Annual Meeting, Philadelphia, Pennsylvania, August 13-17, 2000 / Edited by G.W. Bailey, S. Mckernan, R.L. Price, S.D. Walck, R. Gauvin. |
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